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Shanghai Baihe Instrument Technology Co., Ltd
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Yinuo hardness tester
Bahens hardness tester - surface Rockwell hardness tester
Bahens hardness tester - Rockwell hardness tester
Bahens hardness tester - Brinell hardness tester
Bahens hardness tester - Vickers hardness tester
Bahens hardness tester - micro Vickers hardness tester
metallurgical microscope
a spectrometer
Spectrometer - Atomic Absorption Spectrometer (AA)
Spectrometer - Plasma Emission Spectrometer (ICP)
Spectrometer - X-ray Fluorescence Spectrometer (XRF)
Mal profilometer
Non destructive testing instrument - TOFD testing instrument
Non destructive testing instrument - eddy current testing instrument (ET)
Non destructive testing instrument - phased array testing instrument
Non destructive testing instrument - Magnetic particle testing instrument (MT)
Non destructive testing instrument - ultrasonic testing instrument
Non destructive testing instrument - X-ray testing instrument (RT)
Surface roughness meter
Spectrometer - Direct Reading Spectrometer (OES)
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1316612105513817307074
Address
Building A, Cangyuan Science and Technology Park, 951 Jianchuan Road, Minhang District, Shanghai
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Instrument and meter
A total of
1
products
Omnisacn MX TOFD flaw detector
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1
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