The latest instrument in the ZSX series, ZSX Primus, continues the tradition of providing accurate results in a timely manner, with unparalleled reliability, flexibility, and simplicity suitable for various challenges in today's laboratories. As the experience of science continues to exceed users' expectations, ZSX Primus has become the preferred choice for all X-ray products.
ZSX Primus can flexibly analyze complex samples. 30 μ m ultra-thin window light tube ensures sensitivity for light element analysis. The most advanced mapping package can detect homogeneity and inclusions. ZSX Primus is fully equipped to meet the laboratory challenges of the 21st century.
characteristic:
Analysis scope: Be - U
Smaller footprint
microanalysis
Photo design
30 μ m ultra-thin window
Mapping: Element Distribution
He seal: The sample chamber is always in a vacuum environment
ZSX Primus
Rigaku ZSX Primus provides rapid quantitative determination of primary and secondary atomic elements ranging from beryllium (Be) to uranium (U) with a variety of samples at the lowest standards.
Powerful, flexible and reliable element analysis
As the latest instrument in the Rigaku ZSX series, the ZSX Primus continues the tradition of providing accurate results in a timely and seamless manner, meeting any laboratory challenge today with outstanding reliability, flexibility, and ease of use.
Low Z performance with mapping and multi-point analysis
ZSX Primus has excellent performance and flexibility, capable of analyzing the most complex samples. It features a 30 micron tube, the thinnest terminal window tube in the industry, used for detecting extremely low spectral elements (low Z). Combining state-of-the-art testing kits to detect uniformity and inclusion bodies, ZSX Primus can easily conduct detailed investigations of samples to provide analytical insights that are not easily obtained by other analytical methods. The available multi-point analysis also helps to eliminate sampling errors in non-uniform materials.
Basic parameters of SQX using EZ scan software
EZ scanning allows users to analyze unknown samples without prior configuration. The time-saving feature only requires a few clicks of the mouse and entering the sample name. Combined with SQX basic parameter software, it can provide the most accurate and fastest XRF results. SQX can automatically correct all matrix effects, including line overlap. SQX can also correct the secondary excitation effects of photoelectrons (light and ultra light elements), different atmospheres, impurities, and different sample sizes. Using a matching library and a perfect scanning analysis program can improve accuracy.
characteristic
Element analysis from Be to U
Small footprint, limited laboratory space used
Microanalysis can analyze samples as small as 500 μ m
The design under the pipeline has been optimized for liquids and loose powders
30 μ tube provides excellent light element performance
Map the terrain/distribution of elements in the mapping function
Helium sealing means that optical components are always in a vacuum state