Adopting an upward illumination design, there is no need to worry about contaminating the light path, cleaning difficulties, and increasing cleaning time. Combining all the advantages of the ZSX series: dual vacuum system, automatic vacuum control, mapping/micro area analysis, ultra light element super sensitivity, and automatic core wire cleaning. ZSX Primus IV can flexibly analyze complex samples. 30 μ m ultra-thin window light tube ensures sensitivity for light element analysis. The most advanced mapping package can detect homogeneity and inclusions. ZSX Primus IV is fully equipped to meet the laboratory challenges of the 21st century

Scope of Feature Analysis:

Micro area analysis with a small footprint of Be-U, designed with a 30 μ m ultra-thin window mapping: element distribution, He sealing: the sample chamber is always in a vacuum environment

ZSX Primus IV

Rigaku ZSX Primus IV is a tube type continuous wavelength dispersive X-ray fluorescence (WDXRF) spectrometer that can quickly and quantitatively determine the primary and secondary atomic elements in beryllium (Be) to uranium (U), with sample types based on minimum standards.

New ZSX guidance expert system XRF software

ZSX provides support for various aspects of XRF measurement and data analysis. Can accurate analysis only be conducted by experts? No, that's the past. The ZSX Guidance software has built-in XRF expertise and skilled expert knowledge to handle complex settings. The operator only needs to input basic information about the sample, analysis components, and standard composition. Measurement lines with minimal overlap, optimal background, and correction parameters (including line overlap) can be automatically set using mass spectrometry.

Excellent performance of light element XRF and superior reliability of inverted optics

The ZSX Primus IV features innovative optical configurations as described above. Due to the maintenance of the sample room, there is no longer a need to worry about contaminated beam paths or downtime. The geometric structure above the optical components eliminates cleaning issues and extends usage time. The ZSX Primus IV WDXRF spectrometer has excellent performance and flexibility in analyzing the most complex samples, using a 30 micron tube, which is the thinnest terminal window tube in the industry and provides excellent detection limits for light elements (low Z).

Mapping and multi-point XRF analysis

Combining state-of-the-art mapping packaging to detect uniformity and inclusion, ZSX Primus IV can perform simple and detailed XRF spectroscopic measurements on samples, providing analytical insights that are not easily obtained by other analytical methods. The available multi-point analysis also helps to eliminate sampling errors in non-uniform materials.

Basic parameters of SQX using EZ scan software

EZ scanning allows users to perform XRF elemental analysis on unknown samples without prior configuration. The time-saving feature only requires a few clicks of the mouse and entering the sample name. Combined with SQX basic parameter software, it can provide the most accurate and fastest XRF results. SQX can automatically correct all matrix effects, including line overlap. SQX can also correct the secondary excitation effects of photoelectrons (light and ultra light elements), different atmospheres, impurities, and different sample sizes. Using a matching library and a perfect scanning analysis program can improve accuracy.

characteristic

• Element analysis from Be to U

• ZSX guidance expert system software

• Digital Multi Channel Analyzer (D-MCA)

• Perform routine measurements on the EZ analysis interface

• The optical components above the pipeline minimize pollution issues

• Small footprint, limited laboratory space used

• Microanalysis can analyze samples as small as 500 μ m

• 30 μ tube provides excellent light element performance

• Map the terrain/distribution of elements in the mapping function

• Helium sealing means that optical components are always in a vacuum state

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