ZEISS SteREO Discovery.V16-Fornitore globale

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ZEISS SteREO Discovery.V16

High resolution and high speed: Your zoom microscope's large objective Axio zoom. V16 is ZEISS's high-resolution, anti chromatic aberration corrected

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High Resolution and High Speed: Your Zoom Microscope Large Objective Lens
Axio zoom.
V16 is ZEISS's high-resolution, anti chromatic aberration corrected axial zoom microscope.
16: The zoom range of 1 can be reduced from a large overview (33 millimeters) to
The smallest detail (0.7 μ m).
Use Axio zoom.
The maximum resolution achieved by V16 is as high as
0.3 μ m within the range of 1.6 mm.

This is a particularly advantageous automatic etching for large ceramic tile images.
It reduces image acquisition time, significantly speeding up your analysis tasks.
Configure according to your needs
Microscope
Axio zoom.
V16 (manual focusing)
Axio zoom.
V16 (focusing motor)
Lighting method
Transmitting light: bright field, dark field, oblique field light
Reflected light: bright field, dark field, oblique light, fluorescence
lighting
Cl1500 Eco cold light source, cl6000 LED, cl9000 LED CAN with fiber optic spot;
Circular, straight, vertical, diffuse, surface
And coaxial lighting system;
Visilic ring light source with segmented function, fiber optic and LED transmission light unit
parts
Eyepiece, eyepiece, interchangeable lens, stage,
Polarization devices, binocular and binocular tubes,
Representing the stage, boom represents the stage

Simple. More intelligent. More integration.
Axio zoom.
V16 combines 16 x zoom and 0.25 numerical value
Aperture.
This gives you up to 2.5 times the resolution compared to CMO stereomicroscopes in comparable fields.
The eZoom principle of your Axio Zoom.
The V16 combines a zoom driver with an electronically controlled iris diaphragm.
Select your zoom mode and touch a button: Overview provides maximum resolution at higher magnification and greater depth of field.
EpiGel contrast allows for slight differences in visible height in the brightness field: you can illuminate your sample from a slight lateral angle, even coaxial reflected light.
This creates shadows on the side of the structure, giving your object greater plasticity than traditional bright fields.
Create for your application
Analyze the structural elements of your components, such as phase, grain size, texture, and excretion - including structural defects such as inclusions, pores, holes, cracks, and non-uniformity.
Create an overview image of the entire component and zoom in on the smallest details without changing the target.
Capture the morphology and internal structure of the wafer.

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