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ZEISS Shuttle & Find

Combine the best optical and electron microscopes by combining the optical comparison techniques of optical microscopes with the analytical methods of

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Combining the best optical and electron microscopes together
Combine the optical comparison techniques of optical microscopes with the analysis methods of electron microscopes.
You will receive additional information about the sample structure and function.
The space shuttle and search software module make it easy to use,
The production workflow between your optical microscope and electron microscope.
Use your optical microscope to capture and label points of interest on the sample.
Then, use the "Discovery" space shuttle and its special sample holder to locate these points again in your electron microscope.
Now you can use several times the resolution to depict your sample and continue to examine it in more detail.
These are all completely replicable.

Configure according to your needs
Microscope
Optical microscope: Axio Scope。
A1, Axio zoom.
V16,
Axio imaging device.
M2m, Axio imaging device.
Z2m, Axio Observer.
Z1, Three dimensional discovery
Electron microscope: EVO, Sigma, Crossbeam, gemini
Software AxioVision
Shuttle&Search Software Module SmartSEM
parts
Related microscope sample holder adapter board
Calibration mark
Optional adapter framework

Simple. More intelligent. More integration.
Use Shuttle&Find to connect the sample area of interest in optical and electron microscopy systems.
It stores sample area markers on the light microscope along with their coordinates, so you can locate these areas on the electron microscope in seconds.
Obtain more information from your samples.
Multiple optical contrast techniques are used in optical microscopes to obtain information on size, morphology, and color.
Electron microscopes expand your knowledge through the details of their structure and chemical composition.
All of these resolutions can reach the nanometer level.
Fully automated image analysis, you can rest assured
Reliable and reproducible results.
Create for your application
Analyze residual dirt in the automotive industry.
Firstly, classify metal particles and non-metal particles under an optical microscope.
Then conduct a comprehensive inspection and identification of the particles under an electron microscope.
Use an optical microscope to determine the purity of steel and identify sulfides, oxides, and silicates based on their shape and color.
With the help of an electron microscope, you can characterize atypical inclusions based on their chemical composition using X-ray spectroscopy.
Utilize this precise, fast, and reliable workflow to enhance your productivity in nanomanufacturing.
By using these two microscope systems in a highly automated and efficient manner, you will reduce cycle time and significantly improve throughput

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