Quickly and accurately analyze nanoscale coatings

FT160desktopXRFThe analyzer is designed to measure today'sPCBSmall components on semiconductors and microcontrollers. The ability to accurately and quickly measure small components helps improve productivity and avoid costly rework or component scrap.

FT160The multi capillary optical element can measure less than50 μmThe nano level coating on the features and advanced detector technology can provide you with high accuracy while maintaining short measurement time. Other features such as a large sample stage, wide sample door, high-definition sample camera, and sturdy observation window make it easy to load items of different sizes and find areas of interest on large substrates. This analyzer is easy to use and compatible with yourQA / QCSeamless integration of processes to alert you before any crisis occurs.

Product Highlights

FT160The optical and detector technology is designed specifically for the analysis of micro spots and ultra-thin coatings, optimized for the smallest features.

A large observation window for viewing and analyzing from a safe distance

The measurement method conforms toISO 3497TheASTM B568andDIN 50987standard

IPC-4552BTheIPC-4553ATheIPC-4554andIPC-4556Consistency coating testing

Automatic feature localization for rapid sample setup

Optimized analyzer configuration selection for your application

Less than50 μmMeasure the characteristics of nanoscale coatings

Double the analytical throughput of traditional instruments

Can accommodate large samples of various shapes

Durable design specifically designed for long-term production use