Performance of FT110A X-ray Fluorescence Coating Thickness Measuring Instrument:
1. Release and test immediately!
Complete the measurement of 50nm ultra-thin gold coating in 2.10 seconds!
3. Measurement without standard samples is possible!
4. It is more convenient to select the measurement position through the overall image of the sample!
FT110A X-ray fluorescence coating thickness measuring instrument features:
1. Improve operability through automatic positioning function
When measuring samples, it used to take about 10 seconds to focus the sample, but now it can be completed within 3 seconds, greatly improving the operability of sample positioning.
2. Improve the accuracy of micro area film thickness measurement
By reducing the distance between the sample and the collimator (0.1, 0.2mm), the accuracy of film thickness measurement can be significantly improved.
3. Multi coating measurement with up to 5 layers
By using the thin film FP method software, multi coating measurements of up to 5 layers and 10 elements can be performed even without thickness standards.
4. Wide Area Observation System (optional)
The measurement position can be specified from the overall image of a sample larger than 250 × 200mm.
5. Corresponding to large printed circuit boards (optional)
It can measure large printed circuit boards with dimensions of 600 × 600mm.
6. Low price
Compared with previous models, it has improved functionality and reduced prices by more than 20%.
FT110A X-ray Fluorescence Coating Thickness Measuring Instrument Specification:
model |
FT110A |
Measurement elements |
Atomic numbers Ti (22) to Bi (83) |
x-ray source |
Air-cooled small X-ray tube Tube voltage: 50 (adjustable) kV Tube current: 10-1000 µ A |
detector |
proportional counter tube |
collimator |
○ Type: 0.1 mm Φ, 0.2 mm Φ, and other two types |
Sample observation |
ccd camera |
FOCUS |
Laser focusing (automatic) |
filter |
One time filter (automatic switching) |
Sample area |
[Fixed] 535 × 530 mm [Electric] 260 × 210 mm (movement X: 250 mm, Y: 200 mm) |
measuring software |
Thin film FP method (larger 2 layers, 10 elements), detection line method |
Safety function |
Sample room door interlock, sample conflict prevention function, instrument diagnostic function |
Optional items:
·Image processing software
·Block FP software (material composition analysis)
·Block inspection measurement line software (electroplating solution analysis)