In recent years, restricting the use of environmentally harmful substances has become common and a part of environmental protection efforts. With the introduction of regulations such as RoHS/ELV directives, many companies, including manufacturers, are required to control the amount of restricted substances contained in their products.
The new EA1280 has the detector resolution recommended by the Chinese standard (GB standard), and compared to other semiconductor detectors such as Si PIN diodes, its work efficiency and analysis accuracy are higher. Especially compared with other analytical methods, X-ray fluorescence analysis can provide fast, non-destructive, and simple elemental analysis, so it has been continuously used multiple times in RoHS compliance screening.
1. Use a new high-performance semiconductor detector (silicon drift detector (SDD)) to improve testing efficiency and obtain more reliable results.
2. Use coaxial optical devices for sample observation and X-ray irradiation, facilitating the analysis of various samples.
3. Equipped with user-friendly software, allowing operators to use the analyzer with only simple quality control and process control training. model EA1280 Measurement element range 13Al~ 92U Collimator (analyzing spot size) 5 mm Φ (1, 3 mm Φ: optional) Primary filter (for optimizing performance) 5 modes (4 filters+off) automatic switching Sample compartment ambient atmosphere detector High performance SDD Analyzer size 520 (width) × 600 (depth) × 445 (height) mm weight About 69 kg Sample compartment size 304 (width) × 304 (depth) × 110 (height) mm EA1280 is the latest model to join the Hitachi EA1000 series analyzer, with powerful analytical capabilities that can meet a wide range of testing requirements.EA1280 Technical Specifications