Brand: Gatan Model: MICROTEST Series

Manufacturer: Gatan Company, USA Distributor: Obotong Co., Ltd

Scanning electron microscopy in-situ tensile stage is a means of dynamically observing and analyzing the micro deformation morphology and fracture mechanism of materials, which plays an important role in materials science research.

GATAN's MICROTEST series sample stage can be used for tensile testing of many materials, such as metal materials (studying toughness fracture process, stress-induced phase transformation, plastic deformation, etc.), polymer materials, etc. By using scanning electron microscopy to perform in-situ imaging of the morphological changes in the microstructure, we can gain a deeper understanding of the reasons behind these changes and image the timing of the changes. Combining information from dynamic experiments can overcome the uncertainty factors in interpreting traditional stress/strain data. We offer a variety of devices for stretching, squeezing, and bending tests, with load ranges from 2N to 5000N.

The MICROTEST in-situ stretching table is specially designed for SEM and comes in four versions: 200N, 300N, 2KN, and 5KN

Technical features of MICROTEST series stretching table:

Larger load range: 200N, 300N, 2000N, and 5000N

The replaceable weighing sensor has a range as small as 2N

Strain rate: 5 μ m/min to 6 mm/min

Optional 3-point and 4-point horizontal bending attachments

EBSD sample attachment

Customized jaws equipped on heating and cooling tables

The simple software user interface provides real-time quantitative data curves, combined with flexible thresholds to conduct complex experiments, including cyclic loading.

Support synchronous image and data acquisition. Detailed analysis of the sample change process can be conducted by influencing it.

1. MICROTEST 200 series stretching table

The dynamic testing platform can be operated both inside and outside the SEM. With a load of 200 N, it can perform stretching and squeezing operations, and can be equipped with 3 or 4 bending points in the horizontal direction. MICROTEST 200B can achieve vertical three-point bending.

2. MICROTEST 300 series stretching table

The dynamic testing platform can be operated both inside and outside the SEM. With a load of 300 N, it can perform stretching and squeezing operations, and can be equipped with 3 or 4 bending points in the horizontal direction. MICROTEST 300B can achieve vertical three-point bending.

3. MTEST2000 series stretching table

MTEST2000 and MTEST2000E dynamic testing sample stage modules, with a large load of 2000N, can be used both inside and outside the scanning electron microscope (SEM). MTEST2000 can operate in either tension or compression mode and can be optionally equipped with a horizontal bending fixture. MTEST2000B is designed for vertical 3-/4-point bending. The MTEST2000E stretching table is designed for scanning electron microscopy research with EBSD configuration (MICROTEST 2000ES room temperature version, MICROTEST 2000EW water-cooled version, which are the basic configurations of heating fixtures, and EH 2000 can be optionally selected to achieve tensile testing under heating conditions).

4. MTEST5000 series stretching table

MTEST5000 is a high load (5000N) dynamic testing sample stage module that can operate in either tension or compression mode. It can perform tension and compression operations and is compatible with 3 or 4 point bending in the horizontal direction. (MICROTEST 5000S is the room temperature version, MICROTEST 5000W is the water-cooled version, which is the basic configuration of the heating fixture. At the same time, H5000 can be optionally selected for tensile testing in both heating and cooling states.)