Research grade scanning electron microscope for material analysis using Zeiss EVO 18

Complete material analysis solution
EVO 18 is an analytical microscope with the ability to handle all types of materials, providing you with excellent imaging quality. Standard configuration includes interfaces for energy dispersive spectroscopy (EDS) and spectroscopy (WDS). Upgrading the LaB6 high brightness light source will elevate the probe current performance related to X-ray analysis to a whole new level. The five segment diode backscattered electron (BSE) detector of EVO 18 scanning electron microscope helps enhance low voltage performance and provide richer morphological information. For non-conductive samples, electron beam lining technology can effectively improve resolution. Regardless of the difficulty of material analysis applications, EVO 18 always makes your samples clear and distinguishable.

Zeiss EVO 18: simpler, smarter, and more highly integrated

Application Case of Zeiss EVO 18

Application Unlimited

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Customize the system according to your needs using the EVO 18 Research and EVO 18 Particle Analyzer add-on options.

Technical Parameter
EVO 18 main parameters:
Future upgradable pathway: electron beam lining tube
Image storage:
Resolution: up to 3072 x 2304 pixels
Collecting signals through the integral mean method
Image display:
High quality flat panel display capable of displaying SEM images with a resolution of 1024 x 768 pixels
Support dual channel display
System control:
SmartSEM * * graphical user interface operated through mouse and keyboard
Windows ® 7 multilingual versions
Practical needs:
100 - 230 V， 50 or 60 Hz single-phase
No need for water cooling
Equipped with joystick, American standard keyboard, American standard control panel, and mouse
*OptiBeam - Control the highest resolution, maximum field of view, or optimal depth of field with an active tube
**SmartSEM -5th Generation Scanning Electron Microscope Control Image User Interface