Multi functional atomic force microscope platform to meet the needs of nanoscale measurements

• Atomic force microscopy (AFM) has the ability to capture images with nanoscale resolution and measure electrical, magnetic, thermal, and mechanical properties.
• The nanotube scanning system can be used for high-resolution scanning ion conductivity microscopy (SICM)
• Inverted optical microscope (IOM) facilitates the integration of transparent material research and fluorescence microscopy.

overview

Verified NX10 performance

By inverting the optical microscope sample platform, Park NX12 combines the versatility and accuracy of Park atomic force microscopy. This makes it easier for users to use nanotube technology to study transparent, opaque, or soft or hard samples.

An excellent platform for electrochemical testing

Electrochemical research on batteries, fuel cells, sensors, and corrosion is a rapidly growing field, and many atomic force microscopes cannot directly meet its specific needs. The humanized design of Park NX12 provides convenience for quick operation, thus achieving the functionality and flexibility required by chemical researchers. This mainly includes:

• Multi functional and easy-to-use electrochemical cell
• Environmental control options for inert gases and humidity
• Compatibility of dual potentiometers

Researchers can use the Park NX12 platform to achieve various electrochemical applications:

• Scanning Electrochemical Microscopy (SECM)
• Scanning electrochemical cell microscope (SECCM)
• Electrochemical Atomic Force Microscopy (EC-AFM) and Electrochemical Scanning Tunneling Microscopy (EC-STM)

Technical Information

Consider establishing multi-user devices

Park NX12 has been completely rebuilt to meet the needs of multi-user devices. Other atomic force microscopy solutions lack the necessary versatility to meet the multiple needs of users in this device, making it difficult to reasonably control equipment costs. However, the Park NX12 is designed to accommodate standard environmental atomic force microscopy imaging, liquid scanning probe microscopy, optical and nano optical imaging, making it one of the most flexible atomic force microscopes.

Modular design

• Park NX12 is an atomic force microscope platform tailored specifically for the needs of professional electrochemical researchers.
• It provides a universal solution for scanning probe microscopy based on chemical and electrochemical properties, as well as the characteristics of media in gases and liquids, and can be used for a wide range of opaque and transparent materials.
• Park NX12 is a nanotube based on its extensive visible light projection onto scanning probe microscopy technology, which is highly user-friendly.
• The Park NX12 has unparalleled accuracy and is an ideal platform for multi-user devices and professional researchers.

Multifunctional applications

Park NX12 has a wide range of functions, including PinPoint in liquids ™ Nanomechanics, inverted optical microscopy for locating transparent samples, ion conductivity microscopy for imaging ultra soft samples, and improving the visibility of optical properties of transparent samples.

Comprehensive force spectrum method

Park NX12 provides a complete package for nanomechanical characterization in liquid and air, making it an ideal choice for a wide range of applications

modularization

NX12 modular design, easy installation, strong compatibility, can meet your various experimental needs.

Competitive pricing and flexibility suitable for early career researchers

Early career researchers often did not have enough budget to purchase expensive atomic force microscopes. Park NX12 is not only an affordable entry-level choice, but also provides a modular platform that can continue to grow with career development. It is different from other atomic force microscopes with similar prices. The Park NX12 is equipped with advanced research grade precision and functionality, providing nanoscale resolution of its surface morphology for transparent and opaque materials in air and liquid. This makes it possible to achieve the best return on investment for new chemistry, materials science, or biochemistry laboratories.

Park SmartScan ™ Click imaging in automatic mode

Park NX12 is equipped with our SmartScan ™ The operating system makes it one of the easiest to use atomic force microscopes on the market. Its interface is intuitive awesome, even untrained users can scan samples quickly without monitoring. This enables senior researchers to focus their experience on solving larger problems and developing better solutions.

usability

Users of shared laboratories often have diverse backgrounds and varying levels of experience. NX12 provides a simple click interface and automated SmartScan for every user ™ pattern.

1. Click on "Settings"
A small window appears in the system, demonstrating through animation how to set up the instrument and place the sample to be imaged. Normally, this step only takes a few minutes.
2. Click on "Locate"
The system automatically performs frequency scanning on the cantilever, allowing the Z-axis scanner to approach the sample and automatically focus on the sample, allowing the user to move to the target area after seeing the imaging target area.3. Click on "Imaging"
Set all necessary parameters for achieving optimal settings in the system, then enable the cantilever and start scanning the sample. Continue scanning until a complete image is obtained.
end
The cantilever will be moved away from the sample, ready for the next sample imaging operation.