What is modular instrument?

The increasing complexity of equipment and the gradual integration of technology force testing systems to become more flexible, but cost pressures require systems to have a longer lifespan. The only way to achieve these goals is to adopt a software defined modular architecture. Through shared components, high-speed buses, and user-defined open software, modular instruments can be used to meet various needs of today's and future automated testing equipment (ATE).

Digital multimeter and LCR meter

PC based NI digital multimeter (DMM) and LCR meter, optimized for automated testing. These DMMs are suitable for various types of buses from USB to PXI, and can accurately measure voltage, resistance, current, capacitance, inductance, and temperature. Users can combine these DMMs with over 150 NI switch topologies to create a high channel count testing system.

NI PXI-40717 Bit Half PXI Digital Multimeter (DMM) and 1000V Digitizer

• 1.8 MS/s waveform acquisition, 1000V isolation

• 8 DC current range, current sensitivity up to 1 pA

• The most accurate 7-and-a-half digit multimeter in the industry

• Voltage measurement within the range of ± 10nV to 1000 VDC (700 VAC)

• Resistance measurement from 10 µ Ω to 5 G Ω

• ± 500 VDC/Vrms common mode isolation

NI PXI-4065 is a low-priced 6/2 digit multimeter based on PXI

• Basic 6 1/2 DMM measurement function

• 7 built-in measurements - AC/DC voltage measurement, AC/DC current measurement, 2-wire or 4-wire resistance measurement, and diode testing

• ± 300 VDC/Vrms isolation

• Read speed up to 3000 times/s at 4 and a half digits

• Create a high channel data acquisition system using NI PXI switches

• If high-performance DMM is required, NI 407x FlexDMM equipment can be selected

Dynamic signal acquisition, generation, and analysis

The accuracy of sound and vibration signal acquisition and generation reaches up to 24 bits

NI PXIe-4463 Two Channel Dynamic Signal Generator

• 120 dBc total harmonic distortion (THD) to minimize noise generation

• 2 channels, 3 programmable gain ranges

• 51.2 kS/s update rate, capable of generating dynamic signals

• Each channel provides 100 mA current drive at 10V voltage

• Combining NI PXIe-4610 audio amplifier to achieve high-power and low-noise signal generation

• The mXLR connection option provides excellent noise resistance performance

NI 92344 channels, ± 5 V, 51.2 kS/s per channel, 24 bit IEPE

• Software optional IEPE signal conditioning (0 mA or 2 mA)

• The maximum sampling rate per channel is 51.2 kS/s; AC coupling (0.5 Hz)

• 24 bit resolution; 102 dB dynamic range; Anti-aliasing filter

• 4-channel synchronous sampling analog input, ± 5V input range

• Compatible with intelligent TEDS sensors

• NIST Calibration Certificate

NI PCI-44744 Channel 24 Bit Dynamic Signal Acquisition Card

• The maximum sampling rate reaches 102.4kS/s

• 45 kHz non aliasing bandwidth

• IEPE conditioning - can be configured through software

• Voltage range of ± 10V

• 4-channel synchronous sampling analog input channel

• 24 bit resolution, 110dB dynamic range

Oscilloscope/Digitizer Products

The characteristic of a digitizer is that it provides an open architecture and flexible, software customizable functionality, enabling diversified applications in both time and frequency domains. With the help of NI digitizer, you can not only perform standard oscilloscope measurements, but also easily create other instruments such as spectrum analyzers, transient recorders, and ultrasonic receivers. Multiple NI digitizers or multiple NI digitizers can synchronize with other instruments with picosecond level accuracy, achieving high channel count and mixed signal applications.

NI high-speed digital I/O instrument

NI high-speed digital I/O instruments provide advanced interfaces and testing features for today's digital and mixed signal systems. By using PC based digital instruments, you can create flexible and powerful testing systems to solve application challenges ranging from custom communication analysis to terminal functionality testing. NI high-speed digital instruments provide advanced testing functions such as onboard data validation and dedicated data throughput channels on PCI Express interfaces.

signal generator

NI's PXI and PCI signal generators include multifunctional arbitrary waveform generators, function generators, and RF vector signal generators. Whether generating simple sine and clock signals or complex I/Q modulated communication waveforms, NI signal generators can improve your prototypes and testing systems with first-class generation performance and high system processing capabilities.

switch

Whether you are achieving high-precision, low-speed measurements at more than ten testing points, or reflecting the high pass count and high frequency characteristics of integrated circuits, NI can help you maximize equipment reuse, testing processing capabilities, and system upgradability through flexible and modular switching solutions based on PXI or SCXI.