Medium sized tungsten filament scanning electron microscope SU3800/SU3900

Product details:

Medium sized tungsten filament scanning electron microscope SU3800/SU3900 features:

1. Equipped with a multifunctional oversized sample compartment, capable of carrying oversized and overweight samples

2. Can be equipped with detectors that meet various observation needs

3. New algorithms have been adopted to improve the accuracy of automatic focusing

4. Support full field of view movement, SEM MAP supports full field of view observation of oversized samples

5. A simple GUI that can be easily operated with just one mouse

6. Report Creator can generate data reports in batches using the obtained data

7. SEM and EDS integrated functions, equipped with 3D display measurement software Hitachi Map 3D, image measurement software Image pro, and image measurement software Image pro

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