Product Features
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Adopting infinite distanceOptical system and modular functional designMaximum guarantee of imaging quality;
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Equipped with a large field eyepiece and an infinitely long distance flat field achromatic objective lens, the field of view is large and clear;
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Configure a polarizing system to detect the crystallization characteristics of materials;
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Configure two sets of illumination systems, namely, falling light and transmission, which can respectively observe opaque or transparent objects under microscopic conditions;
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Strong functional scalability, can be upgraded to dark field observation,DICDifferential interference observation, etc.
application
8seriesReflective metallographic microscopeSuitable for observation, research, and analysis of small and inconvenient inverted samples, as well as those that require the search for specific target samples within a certain range. This instrument is equipped with a falling light emitter (coaxial reflection) and a transmission light emitter, which can not only identify and analyze the microstructure of various metals, alloy materials, non-metallic substances, as well as the surface conditions of integrated circuits, microparticles, wires, fibers, surface coatings, etc., but also widely used in the electronics, chemical, and instrumentation industries to observe opaque and transparent substances. Such as metals, ceramics, integrated circuits, electronic chips, printed circuit boards, liquid crystal panels, films, powders, carbon powders, wires, fibers, coatings, and other non-metallic materials.
Scalable functionality
High pixel computer imaging system can be selected, and the image can be processed, edited, saved, and output by the computer in various ways(Like printing, etc)Or entering multimedia systems and electronic mailboxes is a new technology synchronized with the field of microscopy in today's world.
At the same time, the "Professional Metallographic Structure Chart Quantitative Analysis Software" can be selected for real-time research and analysis of metallographic charts, such as grain size measurement rating, non-metallic inclusion measurement rating, and pearlite/Measurement rating of ferrite content, measurement rating of graphite spheroidization rate of ductile iron, decarburization layer/Analysis, statistics, and output of graphic and textual reports on the measurement of carburized layer and surface coating thickness.
Product specifications
Specification parameters | MM-8 | |||
Optical path system | Infinite distance correction optical system | ● | ||
viewing head | 30 ° tilt hinge binocular head, adjustable visual acuity, pupillary distance adjustment range: 55mm-75mm | ● | ||
30 ° tilted triple head, adjustable visual acuity, 100% transparent photography | ||||
Large field eyepiece | WF10X(Φ22mm) | ● | ||
Infinite long working distance flat field achromatic objective lens | Magnification | Numerical aperture (N.A.) | Working distance (W.D.) | ● |
5× | 0.12 | 26.10mm | ||
10× | 0.25 | 20.20mm | ||
40×(S) | 0.6 | 3.98mm | ||
60×(S) | 0.7 | 3.18mm | ||
magnification | 50 × -600 × (upgradable to 2000 ×) | ● | ||
Objective Wheel | Five hole inward facing objective lens converter | ● | ||
stage | Double layer mechanical mobile platform | ● | ||
Area 210mm x 140mm, movement range: 75mm x 50mm | ||||
Focuser | Coarse and micro coaxial focusing mechanism with locking and limiting devices | ● | ||
Micro grid value 0.002mm, focusing range 30mm | ||||
Simple polarizing device | Built in polarizer and analyzer group | ● | ||
Falling light illumination system | Equipped with variable aperture light barrier and adjustable field of view light barrier | ● | ||
6V/30W halogen lamp, adjustable brightness, with color filter wheel | ||||
12V/50W halogen lamp, adjustable brightness (for dark field use) | ||||
Transmissive lighting system | Abbe spotlight: NA.1.25, with variable aperture light bar and adjustable field of view light bar | ● | ||
6V/30W halogen lamp, collector, adjustable brightness, with color filter base | ||||
Upgradeable accessories | Eyepiece: 16 × 10 × (divided) | ○ | ||
Objective lens: 20 ×/50 ×/80 ×/100 × (dry) | ○ | |||
Dark field observation system | ○ | |||
DIC observation system | ○ | |||
PUDA High Pixel Digital Imaging System | ○ | |||
Professional metallographic structure chart quantitative analysis software | ○ | |||
Note: ● is standard, ○ is an upgradable accessory |
Instrument completeness
Instrument completeness | ||||
⑴ One instrument host | ⑷ One objective lens wheel | ⑺ One loading platform | ⑽ One set of falling light illumination system | 1 spare fuse |
⑵ Eyepiece tube 1 set | ⑸ Four objective lenses | 1 glass table piece | ⑾ One national standard power cord | One dust cover for the instrument |
⑶ Two eyepieces | (6) One micrometer | (9) Two color filters | 12. One spare light bulb | 1 set of random file archives |
Digital application solution configuration
MM-8C Computer Camera System | MM-8D Digital Camera Camera | ||
⑴ | MM-8 Trinocular Metallographic Microscope | ⑴ | MM-8 Trinocular Metallographic Microscope |
⑵ | High quality CCD adapter lens | ⑵ | Professional digital camera delay mirror |
⑶ | PUDA 14 million USB imported chip microscope camera (using American APTINA high-performance chipset/USB2.0 high-speed communication, high-resolution, perfect color reproduction processing/Ultra Fine patented color rendering technology) | ⑶ | 10 million pixel digital camera (recommended Nikon/Sony) |
⑷ | ToupView is a professional imaging software |