Shanghai Pudan Optical Instrument Co., Ltd
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    16th Floor, Kaihe Sunshine Plaza, No. 3003 Baoyang Road, Baoshan District, Shanghai
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MM-30M Advanced Inverted Metallographic Microscope
MM-30M Advanced Inverted Metallographic Microscope
Product details

Product Features

Adopting an excellent infinite optical system, it can provide outstanding optical performance;

The compact and stable high rigidity body fully embodies the seismic requirements of microscopic operations;

Ø High eye point ultra wide field of view flat field eyepiece, with a field of view of up to Φ 22mm, providing a wider and flatter observation space;

Ø Infinite flat field semi complex achromatic ultra long working distance professional metallographic objective lens, without cover glass design;

Ø Can be equipped with a coaxial low position adjustable mobile ruler and a stage extension plate to expand the application space and meet the needs of different customers;

Modular functional design makes it easy to upgrade the system and achieve functions such as polarized observation and dark field observation;

application

MM-30MseriesInverted metallurgical microscopeMainly used for identifying and analyzing the microstructure of various metals, alloy materials, and non-metallic materials, it is widely used in factories or laboratories for raw material inspection, casting quality identification, or metallographic structure analysis after material treatment, as well as research on surface cracks and spraying and other surface phenomena. It is an effective tool for metallographic analysis of steel, non-ferrous metal materials, castings, coatings, geological lithofacies analysis, and microscopic research of compounds and ceramics in the industrial field. It is an essential instrument for studying material microstructure in metallurgy and materials science, and a capable assistant in scientific research and teaching.

If you choose the "Professional Metallographic Structure Chart Quantitative Analysis Software", you can conduct real-time research and analysis on metallographic charts, such as grain size measurement rating, non-metallic inclusion measurement rating, pearlite/ferrite content measurement rating, ductile iron graphite spheroidization rate measurement rating, decarburization layer/carburization layer measurement, surface coating thickness measurement, etc. Analysis, statistics, and output graphic and textual reports.

Product specifications

Specification parameters MM-30M
Optical path system Infinite distance correction optical system
viewing head Three way observation tube with hinge, 45Tilt and rotate 360 degrees; Pupil distance range: 54mm to 75mm
Visual acuity adjustment ± 5 °; Observation and photography spectral ratio8:2
eyepiece High eye point, large field of view, flat field eyepiece WF10X (Φ 22mm)
Infinite long working distance flat field achromatic objective lens Magnification Numerical aperture (N.A.) Working distance (W.D.)
0.15 10.80mm
10× 0.3 10.00mm
20× 0.45 4.00mm
Infinite long working distance flat field semi destructive metallographic objective lens 50× 0.55 7.80mm
100× 0.8 2.10mm
magnification 50×-1000 x (upgradable to 2000 x)
Objective Wheel Five hole inward facing objective lens converter
stage Metal carrier platform (center hole diameter 12) double-layer mechanical moving platform
Fixed platform size: 160mmX250mm, movement stroke 120 (X) 78 (Y) mm
Focuser Coarse and micro coaxial focusing mechanism with locking and limiting devices
Micro grid value 0.002mm, coarse adjustment stroke38mm、 Maximum sample height 30mm
Simple polarizing device Polarizing mirror plug board360Rotating polarizer insert board
filter 32mm yellow/green/blue/neutral
Falling light illumination system Reflective Kola Illuminator with Variable Aperture Light Barrier and Center Adjustable Field of View Light Barrier
90-240V wide voltage adaptive, reflective Kola lighting fixture
12V/50W halogen lamp center adjustable, brightness adjustable
Digital imaging system High quality 0.5X CCD adjustable focus adapter lens
1Puda-5
0D imported chip CCD digital microscope camera (using SONY ICX452AQ, 1/1.8 "high-performance chipset/USB2.0)
High speed communication, high-resolution, perfect color reproduction processing/Ultra Fine patented color rendering technology) ToupView is a professional imaging software5Upgradeable accessories Eyepiece: 1
× 10 × (divided)4objective lense: 0×/6
0×/80×
Dark field observation system
DIC observation system
PUDA High Pixel Digital Imaging System
Professional metallographic structure chart quantitative analysis software


Note: ● is standard, ○ is an upgradable accessory

Special statement:·The above content is subject to change without prior notice

·Pudan will do its best to provide you with accurate and comprehensive information, but will not be held responsible for any errors or omissions that may occur in the information.

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