Measurement of scratches on phone cases
Measurement requirements
Measure the three-dimensional morphology of the edge of the phone case and detect the location of scratches on the phone case
Overview of Main Features
1. Non contact measurement, integrated design
2. Three dimensional morphology scanning and multifunctional data processing
3. Suitable for precise measurement of various materials
4. Easy to use and convenient to assemble and disassemble
5. Fast scanning speed and high positioning accuracy
6. Repetitive accuracy guarantee from ± 0.5 to ± 1 μ m
7. High stability and strong anti-interference ability


measurement result
The depth of the scratch is about 27 μ m
Addressing the current issues with measuring devices
There are certain requirements for measuring materials
Contact measurement may cause damage to the measuring material
The measurement range is small, the position is uncertain, and the measurement is difficult
Slow measurement speed, low accuracy, and large measurement errors
Complex structure and high cost
