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Iso Plane 81 Highly Integrated and Sensitive Zero Phase Difference Spectrometer
IsoPlane 81 is a highly integrated, zero aberration, built-in low-noise cooling detector spectrometer that integrates an aberration free spectrometer
Product details

Princeton Instruments first launched in 2013Zero aberration spectrometer isoplaneIts design incorporates numerous patented technologies and revolutionary improvements from Princeton Instruments, and plays an important role in cutting-edge research and application development in many laboratories around the world.

This year, Princeton Instruments has launched its latest productIsoPlane 81 spectrometer.IsoPlane 81 is a highly integrated spectrometer with zero aberration and built-in low-noise cooling detectorIntegrated with an aberration free spectrometer and a deep cooling research instrumentCCD camera. Its footprint is only the size of a laptop, but its performance is far superior to traditional spectrometers. The spectrometer is inFurther upgrades have been made based on Fergie's foundationIn addition,IsoPlane 81 also provides a complete accessory ecosystem to simplify operations and is suitable for various testing environments and requirements.




[Keywords]


Zero phase difference/no coma/highly integrated Raman, fluorescence, and absorption microscopy imaging spectrometer/frame transfer CCD architecture/microsecond time resolution




Product specifications and parameters


a spectrometer

focal length

80.8 mm

Numerical Aperture

f/4

Spectral resolution (FWHM)+

0.13nm

Spectrometer coating and spectral range

Silver coating, 400-1100nm

Aluminum coating, 200-1100nm

raster

150 g/mm to 4320 g/mm; User adjustable, rotatable, single grating turret

Scattered light/coma

All wavelengths and grating angles on the entire focal plane are zero

slit

Width: 10-500 μ m; Height: 3.3mm, laser cutting seam

Wavelength accuracy

0.13nm

Wavelength repeatability accuracy

0.015nm


a spectrometer

focal length

80.8 mm

Numerical Aperture

f/4

Spectral resolution (FWHM)+

0.13nm

Spectrometer coating and spectral range

Silver coating, 400-1100nm

Aluminum coating, 200-1100nm

raster

150 g/mm to 4320 g/mm; User adjustable, rotatable, single grating turret

Scattered light/coma

All wavelengths and grating angles on the entire focal plane are zero

slit

Width: 10-500 μ m; Height: 3.3mm, laser cutting seam

Wavelength accuracy

0.13nm

Wavelength repeatability accuracy

0.015nm


ccd camera

model

BRX

BX

chip type

TPI's unique backlit design, deep depletion, frame transfer, eXcelon ® , UV coating

PI's unique backlit style, frame transfer, eXcelon ® , UV coating

Chip efficiency

NIR response enhancement, peak QE>97%

Ultra low dark current, suitable for long-term exposure experiments

Chip target surface

1024 x 256 (1024×512 includes frame transfer storage area)

Minimum cooling temperature

-55 ° C (guaranteed), - 60 ° C (standard)

System reads out noise

4 e- rms @ 200 kHz;

7 e- rms @ 1 MHz;

20 e- rms @ 4.55 MHz

Dark current*

3 e-/pixel/sec

0.03 e-/pixel/sec

Stray light**

<10 -4

Vertical transfer speed

5.6 μ sec/row to 35 μ sec/row (program control)

15.2 μ sec/row to 95 μ sec/row (program control)

Spectral rate

(Continuous)

292 spectra per second (all vertical pixels merged)

124 spectra/second (all vertical pixels merged)

Spectral rate (dynamic mode)

>10000 spectra per second (spectral dynamics mode, 10 rows merged)

>5000 spectra per second (spectral dynamics mode, 10 rows merged)

Nonlinearity rate

<1% @All ADC rates

Software optional gain

1.5 e -/ADU, 3 e -/ADU (typical values) applicable to all ADC rates


Unless otherwise specified, parameters are standard. All parameters are subject to change.

*Tested at -55 ° C;

**Tested under conditions other than a center wavelength of 10nm using a 532nm single-mode laser.




Quantum Efficiency Curve


1589176587(1).jpg




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