◆ The first in China to achieve sample retention and probe movement scanningCommercializationatomic force microscope；

◆ Sample size and weightalmostUnrestricted, especially suitable for oversized sizesofSamples Testing；

◆ The sample stage has strong scalability and is very convenient for multi instrument combination to achieve in-situ detection;

◆ ControllerSample mobile stationAnd the lifting platform，Programmable multi-point position for fast and automated detection;

◆ Longmen style scanning head design, marble base, vacuum suctionAnd magnetic adsorptionType carrier platform；
◆ motorautomaticIntelligent needle insertion method for automatic detection of piezoelectric ceramics, protecting probes and samples；
◆ High magnification assistanceopticsmicroscopicPositioning, real-time observation, and positioning probesas well asSample scanning area；

◆ Integrated scanner non-linear correction user editor, with superior nano characterization and measurement accuracy98%.