v-bestHAST High Voltage Accelerated Aging Test Chamber:The English name Highly Accelerated Stress Test Chamber is used to simulate the high-temperature, high humidity, and high-pressure environment of chips, and conduct accelerated aging tests within a certain period of time to verify the reliability and lifespan of chips in the shortest possible time, thereby improving product quality and reliability.

The industry's first pressure can reach a testing range of 4KG,

► Automatic box door design, button controlled box door opening and closing, built-in pressure protection,

Built in self-developed PID control algorithm ensures the accuracy of temperature, humidity, and pressure values,

► Compatible with constant heat and humidity (HAST) and high-pressure cooking (PCT) tests for unsaturated high-pressure steam,

Meet the testing standards：

AEC Q101 (automotive grade chip)

JIS C0096-2

GB/T2423.40-1997 Environmental testing for electrical and electronic products Part 2: Test methods Cx: Constant humidity and heat of unsaturated high-pressure steam

IEC60068-2-66-1994 Environmental Testing Part 2-66: Test Methods Test Cx: Steady state Damp Heat

Temperature and humidity offset lifetime of JESD22-A100 cycle

JESD22-A101 steady-state temperature, humidity/bias voltage, life test (temperature humidity bias voltage life)

JESD22-A102 High Pressure Steaming Test (Accelerated Moisture Resistance Penetration)

JESD22-A108 Temperature, Bias Voltage, and Operating Life

JESD22-A110 HAST High Acceleration Temperature and Humidity Stress Test

JESD22-A118 High Acceleration Stress Experiment without Bias Voltage UHAST (Unsaturated High Voltage Steam without Bias Voltage)

*Customizable non-standard models with any specifications and parameters