Brooke's Hysitron PI 95 TEM PicoDenter is the first depth sensitive nanoindentation device that can be directly observed within a transmission electron microscope (TEM) With this testing instrument, not only can the mechanical response of nanoscale materials be imaged, but load displacement data can also be obtained simultaneously In addition, the integrated video interface allows synchronization between the load displacement curve and the corresponding transmission electron microscope video

Customized solution for your TEM

Hysitron PI 95 has been carefully designed to work with JEOL FEI、 Hitachi and Zeiss microscopes are compatible. With this instrument, not only can the mechanical reactions of nanoscale materials be imaged, but quantitative mechanical data can also be obtained simultaneously. The integrated video interface allows for load displacement curves and corresponding TEM video synchronization.

Optimized for nanoscale research

Hysitron PI 95 is particularly suitable for the study of nanoscale phenomena. Performing these types of studies in TEM can clarify many possible causes of force or displacement transients, which may include dislocation bursts, phase transitions, delamination, shear bands, or fracture generation.

****Performance of

Hysitron PI 95 adopts three-level control for positioning and mechanical testing. In addition to a three-axis coarse locator and a three-dimensional piezoelectric adjuster for fine positioning, the instrument is also equipped with sensors for electrostatic driving and capacitive displacement sensors for obtaining quantitative nanoscale mechanical testing data.