Zhongshan Anyuan Instrument Co., Ltd
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FT110A | Desktop XRF Coating Thickness Gauge
Product Introduction: FT110A is a desktop XRF analyzer designed to address the challenges of coating analysis in production
Product details

Product Introduction

FT110AIt is a desktop modelXRFThe analyzer is designed to address the challenges of coating analysis in production. powerfulXThe combination of X-ray fluorescence technology and automatic positioning function helps to improve the productivity of electroplating workshops while ensuring that components meet high standards.

Accuracy and reliability support quality controlXRFThe core of analysis, andFT110ACan provide the accuracy required for today's electroplated components. The updated imaging system, automatic sample positioning, and large sample stage make the analyzer very user-friendly, increasing throughput and reducing human errors. powerfulFT110ACapable of measuring up to four layers and substrates simultaneously, it will support your facility 24/7 to meet the highest industry electroplating standards.

Product Features

Designed specifically for high-throughput production, let's take a lookFT110AHow to support your quality control.

Powerful high-sensitivity technology can provide results in seconds

Non destructive testing for finished product safety

Automated functions enhance productivity

Analyze up to four layers and substrates, plus plating solution

Easy for non professional operators to use

The measurement method conforms toISO 3497TheASTM B568andDIN 50987

The large sample compartment can accommodate various samples

Customizable options to suit your application


Technical Specifications

FT110A

Element Range

Ti – U

detector

Proportional counter system

Sample cabin design

Open closed or slotted type

Number of collimators

2 or4

Minimum collimator

0.025 x 0.4 mm

XYSelection of axis sample table

Programmable or fixed

XYAxis sample table travel

250 x 200 mm

program-controlledZaxis travel

150 mm

Maximum sample size

500 x 400 x 150 mm

Sample Focus

Focused laser and optional automatic focusing

Sample View

Camera view and optional second wide-angle camera

Measurement point identification

optional

software

X-ray Station

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