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Cryogenic test chamber
Manufacturer: Linpin Instrument Co., Ltd. Equipment model: LRHS-101-LD Standard configuration: External dimensions: 1100 × 900 × 1350 Studio dimension
Product details

Manufacturer: Linpin Instrument Co., Ltd
Equipment model: LRHS-101-LD
Standard configuration:
Dimensions: 1100 × 900 × 1350
Studio size: 450 × 450 × 500
Special note: 1. The product images and parameters may differ slightly from the actual product. 2. Customization instructions: All specifications are customized according to the customer's actual situation, and non-standard customization is supported. 3. Inventory delivery: In stock, nationwide delivery guarantee! 4. Kind reminder: There are many models of this product, and the cases are for reference only. For more models, please contact customer service!
product details
Performance and configuration of cryogenic test chamber
- Temperature range: -196 ℃~RT
- Temperature uniformity: ≤ 2 ℃ (when unloaded)
- Temperature fluctuation: ± 1 ℃ (when unloaded)
- Heating rate: ≥ 3 ℃/min
- Cooling rate: ≥ 3 ℃/min
- Time setting range: 1 to 60000M
- Outer box material: high-quality A3 steel plate with electrostatic spraying
- Inner box material: imported high-grade stainless steel SUS304
- Thermal insulation material: rigid polyurethane foam+glass fiber
- Temperature controller: Imported "Youyi Control" brand temperature instrument
- Temperature sensor: PT100 platinum resistance thermometer
- Refrigeration method: liquid nitrogen refrigeration
- Standard configuration: 2-layer sample rack, equipped with a condensate water tray, and discharged outside the box
- Safety protection: compressor overpressure and overload, motor overheating, overall equipment under phase/reverse phase overheating, overall equipment timing, leakage protection, overload and short circuit protection
- Power supply voltage: AC220V ± 10% 50HZ AC380V ± 10% 50HZ
- Power: 2.5kW/3.0kW/4.5kW/6.5kW/6.5kW
- Usage environment: 5 ℃~+28 ℃ ≤ 85% RH
Detailed introduction of cryogenic test chamber
The cryogenic test chamber is mainly used in the fields of aviation, aerospace, information, electronics, etc., to determine the environmental adaptability and reliability tests of instruments, electrical products, materials, components, and equipment under high and low temperature single or simultaneous effects, and to measure the electrical performance parameters of the test piece when powered on at the same time.
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