NTEGRA SPECTRA

Interdisciplinary research in the field of nanotechnology: AFM+confocal Raman spectroscopy+SNOM+TERS

Integration of SPM and confocal microscope/Raman scattering spectrometer. Due to the enhanced Raman scattering at the tip, spectroscopy/microscopy can be performed with a resolution of up to 10 nm

TECHNICAL INDEX

NTEGRA Spectra AFM/Confocal Raman and Fluorescence/SNOM/TERS Integration: Key to New Science

The interface has changed, and the most exciting change in the field of microscopy today is where multiple technologies are connected together. NTEGRA Spectra is a great example of combining the full functionality of atomic force microscopy (AFM), confocal Raman spectroscopy, and fluorescence microscopy, and integrating scanning near-field optical microscopy (SNOM) on one platform Different configurations of AFM and confocal Raman/fluorescence microscopy

Unique configuration for vertical simultaneous AFM Raman TERS * and SNOM imaging of opaque samples * TERS: tip enhanced Raman scattering, tip enhanced fluorescence, etc

Inverted Optimized samples for simultaneous AFM Raman ERS * and SNOM imaging on transparent substrates (live cells, nanoparticles, etc.)

Side illumination option is used to facilitate TERS * measurement of opaque samples

Fiber scanning near-field optical microscope (SNOM) is based on quartz fiber SNOM technology.

Cantilever scanning near-field optical microscope (SNOM) is based on SNOM technology with perforated cantilevers.

• Atomic force microscope (30 modes)
• Confocal Raman/Fluorescence/Rayleigh Microscopy
• Scanning Near Field Optical Microscopy (SNOM/NSOM)
• Optimized for cutting-edge enhanced Raman spectroscopy and fluorescence (TERS, TEFS, TERFS) and scattering SNOM (s-SNOM)

All possible solutions for excitation/detection and TERS geometry

Working principle mode:

SPECIFICATION

• Confocal Raman/Fluorescence Microscopy
• AFM / STM： Integration with spectroscopy
• software
• spectroscopy
• Scanning Near Field Optical Microscope (SNOM)
• Optimized for needle tip enhanced Raman scattering (TERS) and other optical techniques related to needle tips
• (S-SNOM, SNIM, TEFS, STM-LE, etc.)

Confocal Raman/Fluorescence Microscopy

• Simultaneous operation of confocal Raman/fluorescence/Rayleigh imaging and atomic force microscopy (one sample scan)
• Diffraction limit spatial resolution: XY 200 nm, Z 500 nm (with immersion objective)
• The buttons on the true faith software can control the electric confocal pinhole for optimal signal and confocal focusing
• Electric variable beam expander/collimator: Adjust the diameter and collimation of the laser beam separately for each laser and each objective lens used
• Full 3D (XYZ) confocal imaging with powerful image analysis capabilities
• Hyperspectral imaging (recording complete Raman spectra at each point of 1D, 2D, or 3D confocal scanning) and further software analysis
• Optical lithography (vector, grating)

AFM / STM： Integration with spectroscopy

• Vertical and inverted optical AFM configurations (optimized for opaque and transparent samples respectively);
• Side lighting options
• The highest resolution (numerical aperture) optical element is used simultaneously with AFM: vertical 0.7 NA, inverted 1.3-1.4 NA
• Simultaneously obtaining AFM/STM and confocal Raman/fluorescence images (one scan)
• Supports all standard SPM imaging modes (30 modes) - combined with confocal Raman/fluorescence
• Low noise AFM/STM (atomic resolution)
• Due to the special design of the optical AFM head, vibrations and thermal drift originating from the optical microscope body can be minimized
• Focus tracking function: Due to AFM Z-feedback, the sample remains focused at all times; High quality confocal images of very rough or tilted samples can be obtained

software

• Seamless integration of AFM and Raman; All AFM/Raman/SNOM experiments and further data analysis were conducted in the same software
• Powerful analysis of 1D, 2D, and 3D hyperspectral images
• Powerful export to other software (Excel, MatLab, Cytospec, etc.)

Spectral analysis*

• 520mm long high-efficiency spectrometer with 4 electric gratings
• Visible, UV and IR spectral range
• Escher grating has ultra-high dispersion; Spectral resolution: 0.007 nm (<0.1 1=''>0.1>)
• Up to 3 different detectors can be installed
• TE cooled (as low as -100 º C) CCD camera. EMCCD camera is optional - for ultra fast imaging
• Photon multiplier (PMT) or avalanche photodiode in photon counting mode
• Photon multiplier for fast confocal laser (Rayleigh) imaging
• Flexible electric polarization optical devices in excitation and detection channels, cross polarization Raman measurement
• Fully automatic switching between different lasers can be achieved with just a few clicks of the mouse

Scanning Near Field Optical Microscope (SNOM)*

• Supports two main SNOM technologies: (i) based on quartz fiber probes, (ii) based on silicon cantilever probes
• All supported modes: transmission, collection, reflection
• Detected all SNOM signals: laser intensity, fluorescence intensity, spectroscopy
• SNOM lithography (vector, grating)

Optimized for tip enhanced Raman scattering (TERS) and other tip related optical technologies such as S-SNOM, SNIM, TEFS, STM-LE, etc

• All existing TERS geometries are available: illuminated/collected from bottom, top, or side
• Different SPM techniques and TERS probes can be used: STM under tapping and shear force modes, AFM cantilever, quartz tuning fork
• Dual scanning (for hotspot mapping in TERS): Scan by sample, scan by pen tip/laser point
• Electrically polarized optical components can generate optimal polarization for TERS

AFM Raman measurement can be performed in air, controlled atmosphere, or liquid - all temperatures are variable (suitable for inverted configurations)

• Some of the listed features are optional - not included in the basic system configuration